• DocumentCode
    757606
  • Title

    Niobium microbolometers for far-infrared detection

  • Author

    MacDonald, Michael E. ; Grossman, Erich N.

  • Author_Institution
    Nat. Inst. of Stand. & Technol., Boulder, CO, USA
  • Volume
    43
  • Issue
    4
  • fYear
    1995
  • fDate
    4/1/1995 12:00:00 AM
  • Firstpage
    893
  • Lastpage
    896
  • Abstract
    Microbolometers have been fabricated using a thin niobium film as the detector element. These detectors operate at room temperature, are impedance matched to planar antennas, and are suitable for broadband use at far-infrared wavelengths. We have achieved responsivities of up to 21 V/W at a bias of 6.4 mA, and electrical noise equivalent powers (NEP) of as low as 1.1×10-10 W/√(Hz) at 1 kHz at a bias of 3.6 mA. At this bias, the detectors are 1/f-noise limited below 1 kHz and are Johnson noise limited above 10 kHz. The 1/f noise in V/√(Hz) increases approximately linearly with bias with a typical level of 0.39 I(mA)/√(f(kHz)) This level of 1/f noise is approximately a factor of 7 below the best reported for bismuth microbolometers
  • Keywords
    1/f noise; bolometers; impedance matching; infrared detectors; niobium; thermal noise; 1/f-noise limited; 3.6 mA; 6.4 mA; Johnson noise limited; Nb; detector element; electrical noise equivalent powers; far-infrared detection; far-infrared wavelengths; impedance matching; microbolometers; planar antennas; responsivities; room temperature operation; Bismuth; Bolometers; Detectors; Dielectric substrates; Impedance; Linear approximation; Niobium; Noise level; Planar arrays; Temperature;
  • fLanguage
    English
  • Journal_Title
    Microwave Theory and Techniques, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9480
  • Type

    jour

  • DOI
    10.1109/22.375241
  • Filename
    375241