DocumentCode :
757610
Title :
Modified branching ratio method for absolute intensity calibration in VUV spectroscopy
Author :
Daltrini, Andre Mascia ; Machida, Munemasa
Author_Institution :
Centro de Componentes Semicondutores, Univ. Estadual de Campinas, Brazil
Volume :
33
Issue :
6
fYear :
2005
Firstpage :
1961
Lastpage :
1967
Abstract :
A new modified branching ratio (MBR) method for the absolute intensity calibration of a vacuum ultraviolet (VUV) spectrometer is presented. The spectrometer is equipped with a multichannel detector, consisting of an open microchannel plate coupled to a charge-coupled device (CCD), or with a single channel photomultiplier. This technique extends the number of calibration points available from those provided by the branching ratio (BR) calibration technique. The MBR method is a variation of the conventional BR method, where we relax the condition that the two spectral emissions, in the visible and VUV spectra, come from the same excited level, to include transitions from different sublevels of the same energy level. However, a critical study of the statistical equilibrium of sublevels from the same ion energy level was necessary. As a result, we have more than doubled the number of calibration points for our spectrometer used in tokamak plasma diagnostics. The appropriate identification of new spectral line pairs for absolute calibration here presented opens the path for future works in other devices with similar plasma conditions or impurities content.
Keywords :
Tokamak devices; calibration; excited states; plasma diagnostics; plasma impurities; plasma toroidal confinement; ultraviolet spectroscopy; CCD; VUV spectra; VUV spectroscopy; absolute intensity calibration; branching ratio method; channel photomultiplier; charge-coupled device; excited level; impurities; ion energy level; microchannel plate; multichannel detector; statistical equilibrium; tokamak plasma diagnostics; vacuum ultraviolet spectrometer; visible spectra; Calibration; Charge coupled devices; Detectors; Energy states; Microchannel; Photomultipliers; Plasma devices; Plasma diagnostics; Spectroscopy; Tokamaks; Calibration; plasma measurements; tokamaks; ultraviolet spectroscopy;
fLanguage :
English
Journal_Title :
Plasma Science, IEEE Transactions on
Publisher :
ieee
ISSN :
0093-3813
Type :
jour
DOI :
10.1109/TPS.2005.860115
Filename :
1556685
Link To Document :
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