• DocumentCode
    757624
  • Title

    Performance evaluation of scene registration and stereo matching for cartographic feature extraction

  • Author

    Hsieh, Yuan C. ; Mckeown, David M., Jr. ; Perlant, Frederic P.

  • Author_Institution
    Sch. of Comput. Sci., Carnegie Mellon Univ., Pittsburgh, PA, USA
  • Volume
    14
  • Issue
    2
  • fYear
    1992
  • fDate
    2/1/1992 12:00:00 AM
  • Firstpage
    214
  • Lastpage
    238
  • Abstract
    Three major areas in the development of competent 3-D scene interpretation system are discussed. First, the importance of accurate automatic scene registration and the difficulty in automated extraction and matching of scene reference points are described. Second, the authors describe two stereo matching algorithms, S1, which is an area-based matcher previously used in the SPAM system, and S2, which is a feature-based matching algorithm based on hierarchical waveform matching. Third, the authors introduce several performance evaluation metrics that made it possible to measure the quality of the overall scene recovery, the building disparity estimate, and the quality and sharpness of the building delineations. Such manually generated scene reference models are critical for understanding strengths and weaknesses of various matching algorithms and in the incremental development of improvements to existing algorithms. Experiments were performed on difficult examples of aerial imagery
  • Keywords
    cartography; computer vision; computerised pattern recognition; remote sensing; 3D scene interpretation; S1; S2; SPAM; area based matching; automatic scene registration; building disparity estimate; cartographic feature extraction; feature-based matching; hierarchical waveform matching; pattern recognition; remote sensing; scene recovery; scene reference models; sharpness; stereo matching; Automatic control; Computer science; Contracts; Error analysis; Feature extraction; Image analysis; Laboratories; Layout; Robustness; Urban areas;
  • fLanguage
    English
  • Journal_Title
    Pattern Analysis and Machine Intelligence, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0162-8828
  • Type

    jour

  • DOI
    10.1109/34.121790
  • Filename
    121790