DocumentCode :
757652
Title :
Using a Wavelength Shifter to Enhance the Sensitivity of Liquid Xenon Dark Matter Detectors
Author :
Bolozdynya, Alexander I. ; Bradley, Adam W. ; Brusov, Pavel P. ; Dahl, C. Eric ; Kwong, John ; Shutt, Tom
Author_Institution :
Dept. of Phys., Case Western Reserve Univ., Cleveland, OH
Volume :
55
Issue :
3
fYear :
2008
fDate :
6/1/2008 12:00:00 AM
Firstpage :
1453
Lastpage :
1457
Abstract :
Liquid xenon dark matter detectors have been successfully employed to search for WIMPs, a proposed dark matter candidate. Increasing the scintillation wavelength from 175 nm to 300-400 nm can increase light collection and consequently improve sensitivity to dark matter. Such a shift increases the reflectivity of common reflector materials, decreases the amount of Rayleigh scattering and boosts the quantum efficiency of photomultiplier tubes. In this paper, we show that depositing p-terphenyl (p-TP) solid wavelength shifter on PTFE reflectors and the entrance window of a photomultiplier tube enhanced light-collection efficiency by 21%. We also observed an anti-correlation between the liquid xenon temperature and electron drift length, indicating that the p-TP dissolves into liquid xenon with a temperature dependent solubility. Possible ways to solve the drift length problem are discussed in the paper.
Keywords :
Rayleigh scattering; astronomical instruments; dark matter; hypothetical particles; liquid scintillation detectors; organic compounds; photomultipliers; reflectivity; solubility; vacuum deposition; PMT entrance window; PTFE reflectors; Rayleigh scattering; WIMPs; electron drift length; light-collection efficiency; liquid xenon dark matter detectors; p-TP; p-terphenyl solid wavelength shifter; photomultiplier tube; photomultiplier tubes; quantum efficiency; reflectivity; scintillation wavelength; temperature dependent solubility; vacuum deposition; wavelength 175 nm; wavelength 300 nm to 400 nm; weakly interacting massive particles; Electrons; Impurities; Photomultipliers; Physics; Rayleigh scattering; Reflectivity; Solid scintillation detectors; Temperature dependence; Wavelength measurement; Xenon; Dark matter; liquid xenon; p-terphenyl; scintillation; time projection chamber; wavelength shifting;
fLanguage :
English
Journal_Title :
Nuclear Science, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9499
Type :
jour
DOI :
10.1109/TNS.2008.919258
Filename :
4545147
Link To Document :
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