• DocumentCode
    757661
  • Title

    Color reflectance modeling using a polychromatic laser range sensor

  • Author

    Baribeau, Réjean ; Rioux, Marc ; Godin, Guy

  • Author_Institution
    Centre d´´Opt. Photonique et Laser, Laval Univ., Que., Canada
  • Volume
    14
  • Issue
    2
  • fYear
    1992
  • fDate
    2/1/1992 12:00:00 AM
  • Firstpage
    263
  • Lastpage
    269
  • Abstract
    A system for simultaneously measuring the 3-D shape and color properties of objects is described. Range data are obtained by triangulation over large volumes of the scene, whereas color components are separated by means of a white laser. Details are given concerning the modeling and the calibration of the system for bidirectional reflectance-distribution functions measurements. A reflection model is used to interpret the data collected with the system in terms of the underlying physical properties of the target. These properties are the diffuse reflectance of the body material, the Fresnel reflectance of the air media interface, and the slope surface roughness of the interface. Experimental results are presented for the extraction of these parameters. By allowing the subtraction of highlights from color images and the compensation for surface orientation, spectral reflectance modeling can help to understand 3-D scenes. A practical example is given where a color and range image is processed to yield uniform regions according to material pigmentation
  • Keywords
    colour; computer vision; computerised pattern recognition; image sensors; measurement by laser beam; reflectivity; reflectometry; spatial variables measurement; 3D shape measurement; Fresnel reflectance; bidirectional reflectance-distribution functions; color images; colour reflectance modelling; computer colour vision; diffuse reflectance; pigmentation; polychromatic laser range sensor; spectral reflectance modeling; surface orientation; triangulation; Calibration; Color; Laser modes; Laser theory; Layout; Optical reflection; Reflectivity; Rough surfaces; Shape measurement; Surface roughness;
  • fLanguage
    English
  • Journal_Title
    Pattern Analysis and Machine Intelligence, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0162-8828
  • Type

    jour

  • DOI
    10.1109/34.121793
  • Filename
    121793