• DocumentCode
    757753
  • Title

    Measurements of noise in Josephson-effect mixers

  • Author

    Schoelkopf, Robert J. ; Zmuidzinas, Jonas ; Phillips, Thomas G. ; LeDuc, Henry G. ; Stern, Jeffrey A.

  • Author_Institution
    Jet Propulsion Lab., California Inst. of Technol., Pasadena, CA, USA
  • Volume
    43
  • Issue
    4
  • fYear
    1995
  • fDate
    4/1/1995 12:00:00 AM
  • Firstpage
    977
  • Lastpage
    983
  • Abstract
    We present new heterodyne receiver results obtained at 100 GHz using resistively-shunted Nb and NbN tunnel junctions. In addition, we have carried out accurate measurements of the available noise power of these devices at the L-band (1.5 GHz) IF frequency. Both the heterodyne and the output noise measurements show that the noise of these devices can be a factor of five or more higher than that predicted by the simple current-biased RSJ model. The noise approaches the appropriate thermal or thermal and shot noise limits for bias voltages where the nonlinearity is not strong (i.e., V>ICRN), but as expected from the RSJ model, can be significantly higher at the low voltages where the mixers are typically biased. The bias voltage dependence of the noise shows structure which is associated with resonances in the RF embedding circuit. Surprisingly, we find that changes in the high-frequency (100 GHz) impedance presented to the junction can dramatically affect the magnitude and voltage dependence of the low-frequency (1.5 GHz) noise. This emphasizes the necessity of very closely matching the junction to free space over a wide frequency range
  • Keywords
    Josephson effect; millimetre wave mixers; millimetre wave receivers; niobium; niobium compounds; shot noise; superconducting device noise; superconducting device testing; thermal noise; 1.5 GHz; 100 GHz; IF frequency; Josephson-effect mixers; L-band; Nb; NbN; available noise power; bias voltage; heterodyne receiver results; resistively-shunted tunnel junctions; shot noise limits; thermal noise limits; voltage dependence; wide frequency range; Circuit noise; Frequency measurement; L-band; Low voltage; Low-frequency noise; Niobium; Noise measurement; Power measurement; Predictive models; Resonance;
  • fLanguage
    English
  • Journal_Title
    Microwave Theory and Techniques, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9480
  • Type

    jour

  • DOI
    10.1109/22.375263
  • Filename
    375263