Title :
Measurement-based model parameters for quasi-optical electron device arrays
Author :
Sjogren, L.B. ; Liu, H.-X.L. ; Qin, X.H. ; Domier, C.W. ; Luhmann, N.C., Jr.
Author_Institution :
Dept. of Electr. Eng., California Univ., Los Angeles, CA, USA
fDate :
4/1/1995 12:00:00 AM
Abstract :
Impedance element values for a Schottky beam control diode array are obtained by curve-fitting quasioptical reflection coefficient measurements to a series RLC array model. The model provides a good representation of the array behavior. Parameters of Schottky varactor arrays tested to-date are summarized. The technique should be applicable to other quasioptical arrays, as well
Keywords :
Schottky diodes; curve fitting; millimetre wave diodes; semiconductor device models; varactors; Schottky beam control diode array; Schottky varactor arrays; array behavior; curve fitting; impedance element values; quasi-optical electron device arrays; quasioptical reflection coefficient measurements; series RLC array model; Circuit testing; Electron devices; Frequency measurement; Impedance; Optical reflection; Polarization; Schottky diodes; Semiconductor diodes; Transmission lines; Varactors;
Journal_Title :
Microwave Theory and Techniques, IEEE Transactions on
