• DocumentCode
    757916
  • Title

    Capacitance estimate for electrostatically actuated narrow microbeams

  • Author

    Batra, R.C. ; Porfiri, M. ; Spinello, D.

  • Author_Institution
    Dept. of Eng. Sci. & Mech., State Univ., Virginia Polytech. Inst., VA
  • Volume
    1
  • Issue
    2
  • fYear
    2006
  • fDate
    12/1/2006 12:00:00 AM
  • Firstpage
    71
  • Lastpage
    73
  • Abstract
    A novel estimate for the line-to-ground capacitance that accurately predicts the pull-in instability parameters for narrow electrostatically actuated microbeams is proposed. Parameters in the proposed formula are obtained by least square fitting data from a fully converged numerical solution with the method of moments. For a narrow microbeam, it is shown that the new formula significantly improves upon classical formulas that neglect fringing field effects due to the finite thickness of the microbeam cross-section
  • Keywords
    beams (structures); capacitance measurement; micromechanical devices; capacitance; electrostatically actuated narrow microbeam; least square fitting data; line-to-ground capacitance; microbeam cross-section; pull-in instability parameters;
  • fLanguage
    English
  • Journal_Title
    Micro & Nano Letters, IET
  • Publisher
    iet
  • ISSN
    1750-0443
  • Type

    jour

  • Filename
    4140873