• DocumentCode
    758000
  • Title

    Evaluation of Melt-Grown, ZnO Single Crystals for Use as Alpha-Particle Detectors

  • Author

    Neal, John S. ; Giles, Nancy C. ; Yang, Xiaocheng ; Wall, R. Andrew ; Ucer, K. Burak ; Williams, Richard T. ; Wisniewski, Dariusz J. ; Boatner, Lynn A. ; Rengarajan, Varathajan ; Nause, Jeff ; Nemeth, Bill

  • Author_Institution
    Oak Ridge Nat. Lab., Inst. of Phys., Oak Ridge, TN
  • Volume
    55
  • Issue
    3
  • fYear
    2008
  • fDate
    6/1/2008 12:00:00 AM
  • Firstpage
    1397
  • Lastpage
    1403
  • Abstract
    As part of an ongoing investigation of the scintillation properties of zinc-oxide-(ZnO)-based scintillators, several melt-grown, ZnO single crystals have been characterized using alpha-particle excitation, infrared reflectance, and room temperature photoluminescence. The crystals, grown by Cermet, Inc., using an oxygen-pressurized melt-growth process, were doped with Group 1 elements (Li), Group 2 elements (Mg), Group 3 elements (Ga, In) and lanthanides (Gd, Er, Tm). The goals of these studies are to better understand the scintillation mechanisms associated with various members of the ZnO scintillator family and to then use this knowledge to improve the radiation detection capabilities of ZnO-based scintillators. One application for which ZnO is particularly well suited as a scintillator is as the associated particle detector in a deuterium-tritium (D-T) neutron generator. Application requirements include the exclusion of organic materials, outstanding timing resolution, and high radiation resistance. ZnO:Ga and ZnO:In have demonstrated fast (subnanosecond) decay times with relatively low light yields, and ZnO(Ga) has been used in a powder form as the associated particle detector for a D-T neutron generator. Four promising candidate materials, ZnO, ZnO:Ga, ZnO:In,Li, and ZnO:Er,Li, were identified in this study. These four samples demonstrated sub-nanosecond decay times and alpha-particle-excited- luminescence comparable to BC-400 fast plastic scintillator. The ZnO:Mg,Ga, ZnO:Gd, and ZnO:Li samples demonstrated appreciable slow (microsecond) decay components that would be incompatible with high-counting-rate applications.
  • Keywords
    II-VI semiconductors; crystal growth from melt; erbium; gadolinium; gallium; indium; infrared spectra; lithium; magnesium; photoluminescence; reflectivity; semiconductor doping; semiconductor growth; solid scintillation detectors; thulium; wide band gap semiconductors; zinc compounds; BC-400 fast plastic scintillator; ZnO:Er,Li; ZnO:Ga; ZnO:Ga,Li; ZnO:Gd; ZnO:In,Li; ZnO:Li; ZnO:Mg,Ga; ZnO:Tm; alpha-particle detectors; alpha-particle excitation; deuterium-tritium neutron generator; group 1 elements; group 2 elements; group 3 elements; high-counting-rate; infrared reflectance; lanthanides; light yield; microsecond decay components; organic material exclusion; oxygen-pressurized melt-growth process; powder form; radiation detection; radiation resistance; room temperature photoluminescence; scintillation properties; subnanosecond decay time; temperature 293 K to 298 K; timing resolution; Ceramics; Crystals; Erbium; Neutrons; Photoluminescence; Radiation detectors; Reflectivity; Solid scintillation detectors; Temperature; Zinc oxide; Associated particle technique; fast scintillators; semiconductor scintillators; zinc–oxide (ZnO);
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/TNS.2008.922829
  • Filename
    4545179