DocumentCode :
758006
Title :
Asymmetrical current conduction across a 50 A Thick aluminium gallium nitride polarisation barrier
Author :
Praharaj, C.J. ; Hwang, J. ; Eastman, L.F.
Author_Institution :
Dept. of Electr. Eng., Cornell Univ., NY
Volume :
1
Issue :
2
fYear :
2006
fDate :
12/1/2006 12:00:00 AM
Firstpage :
112
Lastpage :
115
Abstract :
Rectification by a 50 Aring (5 nm) thick aluminium gallium nitride (AlGaN) polarisation barrier with maximum voltage swing of 27 V is demonstrated. In order to achieve a large voltage swing, the device is constructed with a 3000 Aring (300 nm) thick undoped gallium nitride (GaN) space charge layer adjacent to the barrier to enable a large voltage drop before the advent of impact ionisation breakdown. The spontaneous and piezoelectric polarisation discontinuities at the AlGaN/GaN interfaces determine the band profiles and the thermally assisted tunneling flux of electrons through the barrier. The 3.24 MV cm -1 electric field across the 50 Aring thick barrier at low bias enables efficient tunneling of electrons, despite the large effective electron mass of 0.19. The effective barrier seen by electrons changes from triangular to trapezoidal for one direction of bias and enhances the asymmetry effect. The demonstrated device characteristics show that wide band-gap polarisation barriers can potentially be used as the basic components of high-power microwave limiters
Keywords :
III-V semiconductors; aluminium compounds; dielectric polarisation; electric breakdown; gallium compounds; impact ionisation; piezoelectric semiconductors; rectification; semiconductor heterojunctions; space charge; tunnelling; wide band gap semiconductors; 300 nm; 50 A; AlGaN-GaN; aluminium gallium nitride polarisation barrier; asymmetrical current conduction; asymmetry effect; band profiles; effective barrier; electron mass; high-power microwave limiters; impact ionisation breakdown; maximum voltage swing; piezoelectric polarisation discontinuities; rectification; space charge layer; thermally assisted tunneling flux; voltage drop; wide band-gap polarisation barriers;
fLanguage :
English
Journal_Title :
Micro & Nano Letters, IET
Publisher :
iet
ISSN :
1750-0443
Type :
jour
Filename :
4140882
Link To Document :
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