• DocumentCode
    758074
  • Title

    Buffer delay change in the presence of power and ground noise

  • Author

    Chen, L.H. ; Marek-Sadowska, M. ; Brewer, F.

  • Author_Institution
    Synopsys Inc., Mountain View, CA, USA
  • Volume
    11
  • Issue
    3
  • fYear
    2003
  • fDate
    6/1/2003 12:00:00 AM
  • Firstpage
    461
  • Lastpage
    473
  • Abstract
    Variations of power and ground levels affect very large scale integration circuit performance. Trends in device technology and in packaging have necessitated a revision in conventional delay models. In particular, simple scalable models are needed to predict delays in the presence of uncorrelated power and ground noise. In this paper, we analyze the effect of such noise-on-signal propagation through a buffer and present simple, closed-form formulas to estimate the corresponding change of delay. The model captures both positive (slowdown) and negative (speedup) delay changes. It is consistent with short-channel MOSFET behavior, including carrier velocity saturation effects. An application shows that repeater chains using buffers instead of inherently faster inverters tend to have superior supply-level-induced jitter characteristics. The expressions can be used in any existing circuit performance optimization design flow or can be combined into any delay calculations as a correction factor.
  • Keywords
    MOS integrated circuits; VLSI; circuit optimisation; delays; integrated circuit noise; integrated circuit packaging; buffer delay change; carrier velocity saturation; circuit performance optimization; closed-form formulas; delay models; ground noise; jitter characteristics; noise-on-signal propagation; packaging; repeater chains; short-channel MOSFET behavior; uncorrelated power noise; very large scale integration; Circuit noise; Circuit optimization; Delay effects; Delay estimation; MOSFET circuits; Packaging; Predictive models; Propagation delay; Repeaters; Very large scale integration;
  • fLanguage
    English
  • Journal_Title
    Very Large Scale Integration (VLSI) Systems, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1063-8210
  • Type

    jour

  • DOI
    10.1109/TVLSI.2003.812310
  • Filename
    1218219