Title :
Comparison between Californian and cyclotron SEU tests
Author :
Velazco, R. ; Provost-Grellier, A. ; Chapuis, T. ; Labrunee, M. ; Falguere, D. ; Koga, R.
Author_Institution :
LGI-UGM INPG, Grenoble, France
fDate :
12/1/1989 12:00:00 AM
Abstract :
Experimental equipment for performing heavy-ion testing on programmable integrated circuits is presented. The equipment was used along with two different types of heavy-ion simulator to perform SEU (single-event-upset) tests on representative circuits: a dedicated Cf 252 fission decay source and an 88-in cyclotron. The observed discrepancies between the two results obtained cast doubt on the validity of using californium sources to simulate high-LET (linear-energy-transfer) particles
Keywords :
cyclotrons; environmental testing; integrated circuit testing; ion beam effects; ion sources; logic arrays; radiation hardening (electronics); 88 in; 252Cf source; cyclotron SEU tests; dedicated Cf252 fission decay source; discrepancies; heavy-ion testing; high LET particles simulation; programmable integrated circuits; types of heavy-ion simulator; Aerospace testing; Circuit simulation; Circuit testing; Cyclotrons; Microcomputers; Performance evaluation; Random access memory; Single event upset; System testing; Test equipment;
Journal_Title :
Nuclear Science, IEEE Transactions on
