DocumentCode :
758279
Title :
Efficient Protection Techniques Against SEUs for Adaptive Filters: An Echo Canceller Case Study
Author :
Reviriego, P. ; Maestro, J.A. ; Ruano, O.
Author_Institution :
Univ. Antonio de Nebrija, Madrid
Volume :
55
Issue :
3
fYear :
2008
fDate :
6/1/2008 12:00:00 AM
Firstpage :
1700
Lastpage :
1707
Abstract :
In this paper, novel protection techniques against soft errors for adaptive filters are presented. The new techniques are based on the use of system knowledge in terms of both filter structure and functionality, as well as the application tolerance to soft errors. Adaptive filters by nature recover from soft errors on their coefficients, but in existing implementations the recovery time can exceed what is acceptable for many applications. The proposed techniques dramatically reduce the recovery time after a soft error with an acceptable increment on circuit complexity, as they rely on reusing existing logic. To illustrate these techniques, a case study is presented in which their effectiveness is evaluated using a software-based fault injection platform. Also, their complexity is estimated in terms of the number of equivalent gates generated for the synthesized circuit implementation using a commercial ASIC library.
Keywords :
adaptive filters; application specific integrated circuits; echo suppression; fault tolerance; integrated circuit reliability; radiation hardening (electronics); adaptive filters; circuit implementation; commercial ASIC library; echo cancellation; equivalent gates; protection techniques; radiation hardening; single event upsets; soft error tolerance; software-based fault injection platform; Adaptive filters; Application software; Application specific integrated circuits; Circuit faults; Circuit synthesis; Complexity theory; Echo cancellers; Logic circuits; Protection; Single event transient; Adaptive filters; digital filters; radiation hardening; redundancy; single event upsets (SEUs);
fLanguage :
English
Journal_Title :
Nuclear Science, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9499
Type :
jour
DOI :
10.1109/TNS.2008.924053
Filename :
4545203
Link To Document :
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