DocumentCode :
75831
Title :
Classical Conditioning Mimicked in Junctionless IZO Electric-Double-Layer Thin-Film Transistors
Author :
Changjin Wan ; Jumei Zhou ; Yi Shi ; Qing Wan
Author_Institution :
Sch. of Electron. Sci. & Eng., Nanjing Univ., Nanjing, China
Volume :
35
Issue :
3
fYear :
2014
fDate :
Mar-14
Firstpage :
414
Lastpage :
416
Abstract :
Classical conditioning, a fundamental property in associative learning, has aroused a wide range of interests in neuromorphic engineering. Here, junctionless indium-zinc-oxide (IZO)-based electric-double-layer transistors gated by nanogranular SiO2 proton conducting electrolyte films are proposed to mimic such behavior. Proton-related electrochemical doping can result in evident oxygen vacancy in IZO channel layer, which is demonstrated by X-ray photoelectron spectroscopy measurements. After such electrochemical forming in half part of the IZO channel, conditioning response can be observed by gate-pulse training process.
Keywords :
X-ray photoelectron spectra; electrochemistry; electroforming; field effect transistors; indium compounds; learning (artificial intelligence); photoelectron spectroscopy; semiconductor doping; silicon compounds; solid electrolytes; zinc compounds; IZO channel layer; SiO2; X ray photoelectron spectroscopy measurements; associative learning; classical conditioning; electrochemical forming; gate pulse training process; junctionless IZO electric double layer thin film transistors; nanogranular proton conducting electrolyte films; oxygen vacancy; proton related electrochemical doping; Doping; Emulation; Logic gates; Neurons; Protons; Training; Transistors; Electric-double-layer transistorm; classical conditioning emulation; electrochemical doping;
fLanguage :
English
Journal_Title :
Electron Device Letters, IEEE
Publisher :
ieee
ISSN :
0741-3106
Type :
jour
DOI :
10.1109/LED.2014.2299796
Filename :
6722937
Link To Document :
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