• DocumentCode
    75831
  • Title

    Classical Conditioning Mimicked in Junctionless IZO Electric-Double-Layer Thin-Film Transistors

  • Author

    Changjin Wan ; Jumei Zhou ; Yi Shi ; Qing Wan

  • Author_Institution
    Sch. of Electron. Sci. & Eng., Nanjing Univ., Nanjing, China
  • Volume
    35
  • Issue
    3
  • fYear
    2014
  • fDate
    Mar-14
  • Firstpage
    414
  • Lastpage
    416
  • Abstract
    Classical conditioning, a fundamental property in associative learning, has aroused a wide range of interests in neuromorphic engineering. Here, junctionless indium-zinc-oxide (IZO)-based electric-double-layer transistors gated by nanogranular SiO2 proton conducting electrolyte films are proposed to mimic such behavior. Proton-related electrochemical doping can result in evident oxygen vacancy in IZO channel layer, which is demonstrated by X-ray photoelectron spectroscopy measurements. After such electrochemical forming in half part of the IZO channel, conditioning response can be observed by gate-pulse training process.
  • Keywords
    X-ray photoelectron spectra; electrochemistry; electroforming; field effect transistors; indium compounds; learning (artificial intelligence); photoelectron spectroscopy; semiconductor doping; silicon compounds; solid electrolytes; zinc compounds; IZO channel layer; SiO2; X ray photoelectron spectroscopy measurements; associative learning; classical conditioning; electrochemical forming; gate pulse training process; junctionless IZO electric double layer thin film transistors; nanogranular proton conducting electrolyte films; oxygen vacancy; proton related electrochemical doping; Doping; Emulation; Logic gates; Neurons; Protons; Training; Transistors; Electric-double-layer transistorm; classical conditioning emulation; electrochemical doping;
  • fLanguage
    English
  • Journal_Title
    Electron Device Letters, IEEE
  • Publisher
    ieee
  • ISSN
    0741-3106
  • Type

    jour

  • DOI
    10.1109/LED.2014.2299796
  • Filename
    6722937