DocumentCode :
7584
Title :
A New Soft-Sensor-Based Process Monitoring Scheme Incorporating Infrequent KPI Measurements
Author :
Shardt, Yuri A. W. ; Haiyang Hao ; Ding, Steven X.
Author_Institution :
Univ. of Duisburg-Essen, Duisburg, Germany
Volume :
62
Issue :
6
fYear :
2015
fDate :
Jun-15
Firstpage :
3843
Lastpage :
3851
Abstract :
The development of advanced techniques for process monitoring and fault diagnosis using both model-based and data-driven approaches has led to many practical applications. One issue that has not been considered in such applications is the ability to deal with key performance indicators (KPIs) that are only sporadically measured and with significant time delay. Therefore, in this paper, the data-driven design of diagnostic-observer-based process monitoring schemes is extended to include the ability to detect changes given infrequently measured KPIs. The extended diagnostic observer is shown to be stable and hence able to converge to the true value. The proposed method is tested using both Monte Carlo simulations and the Tennessee-Eastman problem. It is shown that although time delay and sampling time increase the detection delay, the overall effect can be mitigated by using a soft sensor. Furthermore, it is shown that the results are not strongly dependent on the sampling time, but do depend on the time delay. Therefore, the proposed soft-sensor-based monitoring scheme can efficiently detect faults even in the absence of direct process information.
Keywords :
Monte Carlo methods; fault diagnosis; process monitoring; production engineering computing; Monte Carlo simulations; Tennessee-Eastman problem; diagnostic observer-based process monitoring; fault detection; fault diagnosis; infrequent KPI measurements; key performance indicators; soft sensor-based process monitoring; Delay effects; Delays; Eigenvalues and eigenfunctions; Equations; Monitoring; Observers; Stability analysis; Delay; Soft sensor; delay; fault detection; multirate system; sampled data; soft sensor;
fLanguage :
English
Journal_Title :
Industrial Electronics, IEEE Transactions on
Publisher :
ieee
ISSN :
0278-0046
Type :
jour
DOI :
10.1109/TIE.2014.2364561
Filename :
6933868
Link To Document :
بازگشت