DocumentCode :
758408
Title :
Site Solution Preference of \\hbox {Bi}^{3+} in \\hbox {RE}_{2}\\hbox {O}_{3} Scintillators
Author :
Stanek, Christopher R. ; McClellan, Kenneth J. ; Levy, Mark R. ; Grimes, Robin W.
Author_Institution :
Mater. Sci. & Technol. Div., Los Alamos Nat. Lab., Los Alamos, NM
Volume :
55
Issue :
3
fYear :
2008
fDate :
6/1/2008 12:00:00 AM
Firstpage :
1492
Lastpage :
1495
Abstract :
Atomic-scale simulations have been employed to predict the site solution preference of Bi3+ activator cations in a series of RE2O3 scintillators with the bixbyite crystal structure (Ialpha3), where RE denotes a 3+ cation ranging in size from Sc3+ to La3+ . There are two crystallographically unique cation sites in the bixbyite structure, in Wyckoff notation referred to as the 24d and 8b site. It is expected that the spectroscopic properties of an activator cation residing on the 24d site will be different from the same activator cation residing on the 8b site, due to the distinct symmetries (C2 and S6 respectively) of these two sites. Previous studies have revealed two different Bi3+ emissions in Y2O3 corresponding to Bi3+ cations occupying both lattice 24d and 8b sites. By predicting the energy difference of the Bi3+ solution on the 24d and 8b sites, we are able to predict the distribution of Bi3+ in a range of bixbyite compounds.
Keywords :
bismuth; crystal structure; doping profiles; luminescence; rare earth compounds; scintillation; Bi3+ cations; Jk2O3:Bi; Wyckoff notation; activator cation doping level; atomic-scale simulations; bixbyite crystal structure; luminescence; rare earth oxides scintillators; solution preference; Bismuth; Ceramics; Crystalline materials; Crystallography; Lattices; Luminescence; Optical materials; Predictive models; Spectroscopy; Temperature distribution; Atomistic simulation; defect chemistry; rare earth compounds; scintillators;
fLanguage :
English
Journal_Title :
Nuclear Science, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9499
Type :
jour
DOI :
10.1109/TNS.2007.910864
Filename :
4545215
Link To Document :
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