DocumentCode :
758481
Title :
Photo- and Radiation-Stimulated Processes in CsI(Tl) Crystals
Author :
Trefilova, L. ; Grinyov, B. ; Alekseev, V. ; Mitichkin, A. ; Yakovlev, V.Yu. ; Meleshko, A.
Author_Institution :
Inst. for Scintillation Mater., NAS of Ukraine, Kharkov
Volume :
55
Issue :
3
fYear :
2008
fDate :
6/1/2008 12:00:00 AM
Firstpage :
1263
Lastpage :
1269
Abstract :
The process of radiation-chemical coloration of CsI(Tl) crystals with different carbonate ion contamination has been studied. The presence of carbonate in the CsI(Tl) crystals deteriorates their photo- and radiation stability. Possible reasons for the charge carrier delocalization in CsI(Tl) crystals under exposure to daylight and a role of oxygen-containing impurities in the formation of stable radiation defects have been established. A model of the hole activator color center is suggested. According to the model, the Tl2+vc - center is a Tl2+ hole activator center perturbed by a cation vacancy. The electron color centers Tl0va + are stabilized not only by the hole color centers of Tl2+vc - and I3 -, but also by the molecular anions of HCO3 - and CO3 - formed as a result of the photo- and radio-chemical transformation of CO3 2- and OH- ions.
Keywords :
colour centres; impurities; photochromism; radiation effects; scintillation counters; vacancies (crystal); CsI(Tl) crystals; carbonate ion contamination; cation vacancy; charge carrier delocalization; electron color centers; hole color center; impurities; infrared spectroscopy; photochemical transformation; photochromism; photostimulated process; radiation defects; radiation-chemical coloration; radiation-stimulated process; radiochemical transformation; Charge carrier processes; Charge carriers; Contamination; Crystalline materials; Crystals; Impurities; Infrared spectra; Ionizing radiation; Photochromism; Stability; Cesium compounds; infrared spectroscopy; photochromism; radiation effects;
fLanguage :
English
Journal_Title :
Nuclear Science, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9499
Type :
jour
DOI :
10.1109/TNS.2008.924055
Filename :
4545222
Link To Document :
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