Title :
Enhancement of radio frequency device´s contact test using a novel method
Author :
Cheng-Nan Hu ; Wen-Ju Chen ; Hsuan-Chung Ko
Author_Institution :
Dept. of Commun. Eng., Oriental Inst. of Technol., New-Taipei, Taiwan
Abstract :
This investigation describes novel automatic test equipment for verifying the electric contact of radio frequency (RF) traces between RF devices by, for example, the opens and shorts test. An equivalent circuit for modelling the RF device incorporating RF traces with contact impedance is applied for theoretical analysis of the prototype design. The effectiveness of the proposed novel test methodology is then validated. The measured data from experimental testing of RF devices attained in production runs precisely address the contact issue using the novel methodology presented here.
Keywords :
automatic test equipment; equivalent circuits; integrated circuit modelling; integrated circuit testing; prototypes; radiofrequency integrated circuits; RF device modelling; automatic test equipment; electric contact verification; equivalent circuit; prototype design; radio frequency devices; radio frequency traces;
Journal_Title :
Science, Measurement & Technology, IET
DOI :
10.1049/iet-smt.2013.0071