• DocumentCode
    758692
  • Title

    Noise measurements in resonant tunnelling structures as a function of current and temperature

  • Author

    Ciambrone, P. ; Macucci, M. ; Iannaccone, G. ; Pellegrini, B. ; Lazzarino, M. ; Sorba, L. ; Beltram, F.

  • Author_Institution
    Dipartimento di Ingegneria dell´´Inf., Pisa Univ., Italy
  • Volume
    31
  • Issue
    6
  • fYear
    1995
  • fDate
    3/16/1995 12:00:00 AM
  • Firstpage
    503
  • Lastpage
    505
  • Abstract
    The authors present the results of noise measurements performed on custom designed resonant tunnelling structures. The shot-noise suppression has been measured as a function of bias current and temperature in the 14-223 K range, and results have been compared with those predicted by existing theories
  • Keywords
    resonant tunnelling devices; semiconductor device noise; shot noise; 14 to 223 K; bias current; noise measurements; resonant tunnelling structures; shot-noise suppression; temperature;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el:19950315
  • Filename
    375857
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=758692