Title :
Noise measurements in resonant tunnelling structures as a function of current and temperature
Author :
Ciambrone, P. ; Macucci, M. ; Iannaccone, G. ; Pellegrini, B. ; Lazzarino, M. ; Sorba, L. ; Beltram, F.
Author_Institution :
Dipartimento di Ingegneria dell´´Inf., Pisa Univ., Italy
fDate :
3/16/1995 12:00:00 AM
Abstract :
The authors present the results of noise measurements performed on custom designed resonant tunnelling structures. The shot-noise suppression has been measured as a function of bias current and temperature in the 14-223 K range, and results have been compared with those predicted by existing theories
Keywords :
resonant tunnelling devices; semiconductor device noise; shot noise; 14 to 223 K; bias current; noise measurements; resonant tunnelling structures; shot-noise suppression; temperature;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19950315
