• DocumentCode
    758727
  • Title

    The effects of measuring technique and sample preparation on the breakdown strength of polyethylene

  • Author

    Hosier, I.L. ; Vaughan, A.S. ; Swingler, S.G.

  • Author_Institution
    J.J. Thomson Phys. Lab., Reading Univ., UK
  • Volume
    9
  • Issue
    3
  • fYear
    2002
  • fDate
    6/1/2002 12:00:00 AM
  • Firstpage
    353
  • Lastpage
    361
  • Abstract
    The effects of specimen thickness, testing conditions and preparation technique on the measured ramp-breakdown strength of 2 polyethylene systems have been investigated. The obtained data have been found to be highly reproducible, enabling results under different test conditions to be correlated with one another. In all cases, an increase in ramp rate results in an increase in the measured breakdown strength, as does a reduction in sample thickness. Irrespective of the test parameters, the short-term performance of a polyethylene blend containing a designed microstructure is always improved compared to that of the base low density polyethylene alone. Impulse testing leads to an identical conclusion. The effect of the blending method has been shown to have a negligible effect on the breakdown strength, despite consequent changes in nucleation density, implying that it is the local lamellar texture that is responsible for the enhanced properties of the blend
  • Keywords
    dielectric measurement; electric breakdown; impulse testing; insulation testing; polyethylene insulation; polymer blends; specimen preparation; breakdown strength; impulse testing; lamellar texture; low density polyethylene; measuring technique; microstructure; nucleation density; polyethylene; polyethylene blend; ramp rate; sample preparation; specimen thickness; Breakdown voltage; Composite materials; Density measurement; Electric breakdown; Electronic equipment testing; Impulse testing; Morphology; Polyethylene; System testing; Thickness measurement;
  • fLanguage
    English
  • Journal_Title
    Dielectrics and Electrical Insulation, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1070-9878
  • Type

    jour

  • DOI
    10.1109/TDEI.2002.1007697
  • Filename
    1007697