Latest trends in parts SEP susceptibility from heavy ions

Author

Nichols, Donald K. ; Smith, L. S Ted ; Soli, George A. ; Koga, R. ; Kolasinski, W.A.

Author_Institution

Jet Propulsion Lab., California Inst. of Technol., Pasadena, CA, USA

Volume

36

Issue

6

fYear

1989

fDate

12/1/1989 12:00:00 AM

Firstpage

2388

Lastpage

2397

Abstract

JPL and Aerospace have collected a third set of heavy-ion single-event phenomena (SEP) test data since their last joint IEEE publications in December 1985 and December 1987. Trends in SEP susceptibility (e.g. soft errors and latchup) for state-of-the-art parts are presented. Results of the study indicate that hard technologies and unacceptably soft technologies can be flagged. in some instances, specific tested parts can be taken as candidates for key microprocessors or memories. As always with radiation test data, specific test data for qualified flight parts is recommended for critical applications

Keywords

aerospace instrumentation; environmental testing; integrated circuit testing; integrated memory circuits; ion beam effects; microprocessor chips; radiation hardening (electronics); Aerospace; JPL; SEP susceptibility from heavy ions; SEP susceptibility trends; heavy-ion single-event phenomena; latchup; memories; microprocessors; qualified flight parts; radiation test data; soft errors; specific test data; state-of-the-art parts; Aerospace testing; IEEE publications; Ion accelerators; Isotopes; Life estimation; Manufacturing; Microprocessors; Propulsion; Satellites; Single event upset;

fLanguage

English

Journal_Title

Nuclear Science, IEEE Transactions on

Publisher

ieee

ISSN

0018-9499

Type

jour

DOI

10.1109/23.45453

Filename

45453