Title :
Guest editorial: Special section on compound semiconductor microelectronics manufacturing: The future is here
Author :
Jaeger, Richard C. ; del Alamo, Jesus A. ; Fukuta, Masahiro ; Bennett, H.S. ; Snowden, C.M.
Author_Institution :
Agilent Technologies
Keywords :
Circuit testing; Consumer electronics; Electronic equipment testing; Gallium arsenide; Laboratories; Microelectronics; Semiconductor device manufacture; Silicon; Technology management; USA Councils;
Journal_Title :
Semiconductor Manufacturing, IEEE Transactions on
DOI :
10.1109/TSM.2003.815634
