DocumentCode
759738
Title
A 13-b 10-Msample/s ADC digitally calibrated with oversampling delta-sigma converter
Author
Shu, Tzi-Hsiung ; Song, Bang-Sup ; Bacrania, Kantilal
Author_Institution
Dept. of Electr. & Comput. Eng., Illinois Univ., Urbana, IL, USA
Volume
30
Issue
4
fYear
1995
fDate
4/1/1995 12:00:00 AM
Firstpage
443
Lastpage
452
Abstract
Two key techniques necessary to digitally calibrate multistep or pipelined converters are demonstrated in a differential 5-V, 13-b, 10-Msample/s analog-to-digital converter (ADC). One technique, called code-error calibration, is to linearize the transfer characteristic of digital-to-analog converters (DAC´s) while the other, called gain-error proration, is to evenly distribute interstage gain errors over the full conversion range. The core of the former technique is an oversampling delta-sigma ratio calibrator working synchronously with the converter. This digital calibration process constantly tracks and updates the code errors without interfering with the normal operation. The prototype converter fabricated using a 1.4-μm BiCMOS process consumes 360 mW with a 5-V single supply and exhibits a signal-to-noise ratio of 71 dB and a maximum end-point integral nonlinearity of 1.8 LSB at a 13-b level. The proposed techniques can be incorporated into general multistep or pipelined ADC´s without sacrificing the conversion speed
Keywords
BiCMOS integrated circuits; calibration; errors; pipeline processing; sigma-delta modulation; 1.4 micron; 13 bit; 360 mW; 5 V; 71 dB; A/D convertor; ADC; BiCMOS process; analog-to-digital converter; code-error calibration; digital calibration process; gain-error proration; interstage gain errors; multistep ADC; oversampling delta-sigma converter; pipelined ADC; single supply voltage; transfer characteristic; Analog-digital conversion; Calibration; Capacitors; Circuits; Computer errors; Digital-analog conversion; Error correction codes; Linearity; Prototypes; USA Councils;
fLanguage
English
Journal_Title
Solid-State Circuits, IEEE Journal of
Publisher
ieee
ISSN
0018-9200
Type
jour
DOI
10.1109/4.375965
Filename
375965
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