• DocumentCode
    759763
  • Title

    A new scheduling approach using combined dispatching criteria in wafer fabs

  • Author

    Dabbas, Russ M. ; Fowler, John W.

  • Author_Institution
    Semicond. Product Sector, Motorola Inc., Phoenix, AZ, USA
  • Volume
    16
  • Issue
    3
  • fYear
    2003
  • Firstpage
    501
  • Lastpage
    510
  • Abstract
    In this paper, a scheduling approach that combines multiple dispatching criteria into a single rule, with the objective of simultaneously optimizing multiple performance measures is proposed. This is accomplished using a linear combination with relative weights. The weights identify the contribution of the different criteria. The weights´ assignments to the different criteria are optimized using a mixture design of experiments (DOE) and multiple response optimization. Results using this new approach show significant improvement versus the use of a single dispatching criterion.
  • Keywords
    design of experiments; dispatching; integrated circuit manufacture; optimisation; production control; combined dispatching criteria; mixture DOE; mixture design of experiments; multiple dispatching criteria; multiple performance measures optimization; multiple response optimization; scheduling approach; semiconductor manufacturing; wafer fabrication; wafer fabs; Business; Design optimization; Dispatching; Fabrication; Failure analysis; Job shop scheduling; Manufacturing processes; Production facilities; Semiconductor device manufacture; US Department of Energy;
  • fLanguage
    English
  • Journal_Title
    Semiconductor Manufacturing, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0894-6507
  • Type

    jour

  • DOI
    10.1109/TSM.2003.815201
  • Filename
    1219498