• DocumentCode
    759873
  • Title

    Analysis and Measurement of Signal Distortion due to ESD Protection Circuits

  • Author

    Chun, Jung-Hoon ; Murmann, Boris

  • Author_Institution
    Center for Integrated Syst., Stanford Univ., CA
  • Volume
    41
  • Issue
    10
  • fYear
    2006
  • Firstpage
    2354
  • Lastpage
    2358
  • Abstract
    Electrostatic discharge (ESD) protection circuits typically contain a significant amount of nonlinear capacitance. At high frequencies and large amplitudes, this nonlinearity can degrade the signal integrity at the input pins of high performance mixed signal ICs, such as analog-to-digital converters (ADCs). This study provides a theoretical analysis of this problem as well as experimental results that quantify typical distortion levels introduced by state-of-the-art ESD structures. It is shown that with distortion targets nearing -100 dBc at signal frequencies on the order of 100MHz, ESD circuits will become a limiting factor in the future. In addition to these results, this study offers some brief guidelines for designing ESD protection circuits suitable for high-speed, high-linearity applications
  • Keywords
    CMOS integrated circuits; distortion; electrostatic discharge; integrated circuit noise; 100 MHz; CMOS analog integrated circuits; analog-to-digital converters; electric distortion; electrostatic discharge; mixed signal integrated circuits; nonlinear capacitance; protection circuits; signal distortion; Capacitance; Circuits; Degradation; Distortion measurement; Electrostatic discharge; Electrostatic measurements; Frequency conversion; Nonlinear distortion; Protection; Signal analysis; CMOS analog integrated circuits; electric distortion; electrostatic discharge;
  • fLanguage
    English
  • Journal_Title
    Solid-State Circuits, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9200
  • Type

    jour

  • DOI
    10.1109/JSSC.2006.881550
  • Filename
    1703690