Title :
Silicon micro XY-stage with a large area shuttle and no-etching holes for SPM-based data storage
Author :
Kim, Che-Heung ; Jeong, Hee-Moon ; Jeon, Jong-Up ; Kim, Yong-Kweon
Author_Institution :
Sch. of Electr. Eng. & Comput. Sci., Seoul Nat. Univ., South Korea
Abstract :
A micro XY-stage with a 5×5 mm2-area shuttle is fabricated for application in a nanometer-scale data storage device. A central shuttle of the device is designed as a large square on which a high-density recording medium is deposited. Perpendicularly combined comb-drive actuators allow the large shuttle free access in the x-y plane. No etching holes on the central shuttle are preferred in order to maximize the effective recording area. Therefore, a novel release process, Micro-Channel Assisted Release Process (μCARP) is proposed to release a large plate structure without any etching holes and to resist downward sticking. The static and dynamic strokes of the device were measured. Mechanical interferences between x-and y-directional drives were estimated by finite-element method (FEM) analysis and compared with the experimental results.
Keywords :
digital storage; electrostatic actuators; elemental semiconductors; finite element analysis; nanoelectronics; scanning probe microscopy; silicon; μCARP; 5 mm; FEM analysis; SPM-based data storage; Si; Si micro XY-stage; dynamic strokes; finite-element method; high-density recording medium deposition; high-density storage; large area shuttle; large plate structure release; micro-channel assisted release process; nanometer-scale data storage device; perpendicularly combined comb-drive actuators; scanning probe microscopy; static strokes; Actuators; Etching; High speed optical techniques; Memory; Nanoscale devices; Optical films; Optical microscopy; Optical recording; Scanning probe microscopy; Silicon;
Journal_Title :
Microelectromechanical Systems, Journal of
DOI :
10.1109/JMEMS.2003.809960