Title :
Microelectromechanical Systems Tunable Frequency-Selective Surfaces and Electromagnetic-Bandgap Structures on Rigid-Flex Substrates
Author :
Coutts, Gordon M. ; Mansour, Raafat R. ; Chaudhuri, Sujeet K.
Author_Institution :
Electr. & Comput. Eng. Dept., Waterloo Univ., Waterloo, ON
fDate :
7/1/2008 12:00:00 AM
Abstract :
A novel microelectromechanical systems (MEMS) process is developed to fabricate large numbers of high-performance MEMS devices monolithically integrated onto a rigid-flex organic substrate using low-temperature processes. The rigid-flex substrate is all dielectric, which is amenable to low-loss electromagnetic structures. The substrate provides mechanical support to the MEMS devices while maintaining overall flexibility. The newly developed process is used to fabricate a MEMS reconfigurable frequency-selective surface (FSS). A practical bias network is incorporated into the structure design to ensure that all devices are actuated simultaneously. A detailed parametric sensitivity analysis establishes the robustness of the FSS design with respect to fabrication process variations. FSS structures operating in the Ku- and Ka-bands are fabricated and tested with good correlation between simulated and measured results. The newly developed MEMS process is also used to fabricate a reconfigurable electromagnetic-bandgap (EBG) structure. An EBG structure operating in the Ka -band is fabricated and tested to verify the validity of the proposed concept.
Keywords :
frequency selective surfaces; micromechanical devices; microwave filters; microwave materials; photonic band gap; FSS; MEMS; detailed parametric sensitivity analysis; electromagnetic-bandgap structures; low-loss electromagnetic structures; low-temperature processes; microelectromechanical systems; reconfigurable frequency-selective surface; rigid-flex substrates; tunable frequency-selective surfaces; Flexible structures; frequency-selective surfaces (FSSs); microelectromechanical devices; polyimide films;
Journal_Title :
Microwave Theory and Techniques, IEEE Transactions on
DOI :
10.1109/TMTT.2008.925575