Title :
An improved procedure to calculate the refractive index profile from the measured near-field intensity
Author :
Mansour, I. ; Caccavale, F.
Author_Institution :
Dipartimento di Elettronica e Inf., Padova Univ., Italy
fDate :
3/1/1996 12:00:00 AM
Abstract :
Refractive index profile of optical waveguides is reconstructed from the measured transmitted near-field intensity. A Butterworth low-pass digital filter is employed in the frequency domain to remove impulsive and high frequency fluctuations which have severe effects on the procedure to calculate the index profile from the measured power intensity. The proposed method has been applied to measure the index profile of monomode optical fiber, Ti:LiNbO3 and buried MgTi:LiNbO3 channel waveguides
Keywords :
Butterworth filters; intensity measurement; lithium compounds; low-pass filters; magnesium; optical fibre testing; optical waveguides; refractive index measurement; titanium; Butterworth low-pass digital filter; LiNbO3:Mg,Ti; LiNbO3:Ti; Ti:LiNbO3 channel waveguides; buried MgTi:LiNbO3 channel waveguides; frequency domain; high frequency fluctuations; impulsive fluctuations; monomode optical fiber; near-field intensity; optical waveguides; refractive index profile; transmitted near-field intensity; Digital filters; Fluctuations; Frequency domain analysis; Frequency measurement; Optical filters; Optical refraction; Optical variables control; Optical waveguides; Power measurement; Refractive index;
Journal_Title :
Lightwave Technology, Journal of
