An improved procedure to calculate the refractive index profile from the measured near-field intensity

Author

Mansour, I. ; Caccavale, F.

Author_Institution

Dipartimento di Elettronica e Inf., Padova Univ., Italy

Volume

14

Issue

3

fYear

1996

fDate

3/1/1996 12:00:00 AM

Firstpage

423

Lastpage

428

Abstract

Refractive index profile of optical waveguides is reconstructed from the measured transmitted near-field intensity. A Butterworth low-pass digital filter is employed in the frequency domain to remove impulsive and high frequency fluctuations which have severe effects on the procedure to calculate the index profile from the measured power intensity. The proposed method has been applied to measure the index profile of monomode optical fiber, Ti:LiNbO₃ and buried MgTi:LiNbO₃ channel waveguides

Keywords

Butterworth filters; intensity measurement; lithium compounds; low-pass filters; magnesium; optical fibre testing; optical waveguides; refractive index measurement; titanium; Butterworth low-pass digital filter; LiNbO₃:Mg,Ti; LiNbO₃:Ti; Ti:LiNbO₃ channel waveguides; buried MgTi:LiNbO₃ channel waveguides; frequency domain; high frequency fluctuations; impulsive fluctuations; monomode optical fiber; near-field intensity; optical waveguides; refractive index profile; transmitted near-field intensity; Digital filters; Fluctuations; Frequency domain analysis; Frequency measurement; Optical filters; Optical refraction; Optical variables control; Optical waveguides; Power measurement; Refractive index;

fLanguage

English

Journal_Title

Lightwave Technology, Journal of

Publisher

ieee

ISSN

0733-8724

Type

jour

DOI

10.1109/50.485603

Filename

485603