DocumentCode :
760460
Title :
Time-domain electromagnetic penetration through arbitrarily shaped narrow slots in conducting screens
Author :
Reed, Erik K. ; Butler, Chalmers M.
Author_Institution :
KEMET Electronics Corp., Greenville, SC, USA
Volume :
34
Issue :
3
fYear :
1992
fDate :
8/1/1992 12:00:00 AM
Firstpage :
161
Lastpage :
172
Abstract :
A time-domain integral equation is derived for the unknown electric field, or equivalent magnetic surface current, in a narrow slot in a conducting surface, and an efficient and stable numerical method is developed for solving this equation. The contour of the slot in the vanishingly thin conducting surface may be of any shape. The solutions are compared via Fourier transformation with those of the corresponding time-harmonic integral equation, and they are further validated by demonstrating close correlation between values of the calculated field on the shadow side of the conductor and data from laboratory measurements. For numerous slot lengths and shapes, time- and frequency-domain data illustrating the behavior of the slot field and penetrated field are presented and compared with measured results. The stability of the time-domain solution technique is investigated and found to be very high. The response of a slot to an EMP-type (electromagnetic pulse type) pulse is presented as an example
Keywords :
electromagnetic field theory; electromagnetic pulse; electromagnetic wave propagation; integral equations; time-domain analysis; EMP; Fourier transformation; arbitrarily shaped narrow slots; conducting screens; electromagnetic penetration; electromagnetic propagation; electromagnetic pulse; equivalent magnetic surface current; frequency-domain; numerous slot lengths; penetrated field; shadow side; slot field; stable numerical method; time-domain; time-domain integral equation; time-harmonic integral equation; unknown electric field; vanishingly thin conducting surface; Conductors; EMP radiation effects; Electromagnetic measurements; Frequency measurement; Integral equations; Laboratories; Length measurement; Magnetic field measurement; Shape measurement; Time domain analysis;
fLanguage :
English
Journal_Title :
Electromagnetic Compatibility, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9375
Type :
jour
DOI :
10.1109/15.155826
Filename :
155826
Link To Document :
بازگشت