Title :
High-power microwave test facility based on double-anode relativistic tetrode (DART) oscillators
Author :
Miner, Lynn M. ; Voss, Donald E. ; Koslover, Robert A. ; Miera, Bill M. ; Cremer, C. David ; Biggs, Albert W.
Author_Institution :
Phillips Lab., Kirtland AFB, NM, USA
fDate :
8/1/1992 12:00:00 AM
Abstract :
High-power microwave (HPM) sources for testing systems and components at high peak powers and high energy fluences are described. Peak powers of up to 400 MW are radiated using a 150 ns, 650 kV pulse-power device to drive a class of microwave tubes termed double-anode relativistic tetrode oscillators. The DART class of devices is particularly useful for facility testing because the devices (1) provide pencil beam output at high exposure levels, (2) are fully tunable over ~25% bandwidth, and (3) are compatible with a wide variety of low-cost horns which provide various antenna gains. A 1 MW L-band magnetron provides power densities and energy fluences exceeding 500 W/cm2 and 2 mJ/cm2 for μs pulse lengths at repetition rates to 120 Hz. The RF test environment is characterized using redundant in-situ and free-field RF diagnostics and a VAX-based data acquisition and archival system. The capability for both single-shot and repetitive testing is discussed
Keywords :
electromagnetic compatibility; microwave generation; microwave tubes; relativistic electron beam tubes; test facilities; tetrodes; 1 MW; 400 MW; 650 kV; DART oscillators; EMC; L-band magnetron; RF test environment; VAX-based data acquisition; double-anode relativistic tetrode oscillators; electromagnetic compatibility; free-field RF diagnostics; high energy fluences; high exposure levels; high peak powers; high power microwave test facility; in-situ RF diagnostics; pencil beam output; pulse-power device; repetitive testing; single-shot testing; Anodes; Bandwidth; Costs; Horn antennas; Laboratories; Microwave devices; Microwave oscillators; Radio frequency; System testing; Test facilities;
Journal_Title :
Electromagnetic Compatibility, IEEE Transactions on