• DocumentCode
    760679
  • Title

    A Controlled-Temperature Device for Transistor Tests

  • Author

    King, E.F. ; Walker, F.L.

  • Author_Institution
    Elec. Engrg. Dept., University of California, Los Angeles, Calif.
  • Volume
    4
  • Issue
    1
  • fYear
    1961
  • fDate
    3/1/1961 12:00:00 AM
  • Firstpage
    21
  • Lastpage
    22
  • Abstract
    A laboratory device for operating transistors at selected, known temperatures in the 15-95-degrees C range is described. After a simple, one-time calibration no further temperature measurements are necessary. The unit is simple, rugged and easily constructed.
  • Keywords
    Aluminum; Calibration; Electrical resistance measurement; Laboratories; Leg; Resistors; Temperature measurement; Testing; Thermal conductivity; Time measurement;
  • fLanguage
    English
  • Journal_Title
    Education, IRE Transactions on
  • Publisher
    ieee
  • ISSN
    0893-7141
  • Type

    jour

  • DOI
    10.1109/TE.1961.4322170
  • Filename
    4322170
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=760679