DocumentCode :
760976
Title :
A new analytical diode model including tunneling and avalanche breakdown
Author :
Hurkx, G.A.M. ; de Graaff, H.C. ; Kloosterman, W.J. ; Knuvers, M.P.G.
Author_Institution :
Philips Res. Lab., Eindhoven, Netherlands
Volume :
39
Issue :
9
fYear :
1992
fDate :
9/1/1992 12:00:00 AM
Firstpage :
2090
Lastpage :
2098
Abstract :
An analytical model describing reverse and forward DC characteristics is presented. It serves as a basis for a compact model for circuit simulation purposes. The model is based on the solution of the hole continuity equation in the depletion layer of a p-n junction and incorporates the following physical mechanisms: band-to-band tunneling, trap-assisted tunneling (both under forward and reverse bias), Shockley-Read-Hall recombination, and avalanche breakdown. It contains seven parameters which can be determined at one temperature. No additional parameters are needed to describe the temperature dependence. From comparisons with both numerical simulations and measurements it is found that the model gives an adequate description of the DC characteristics in both forward and reverse modes
Keywords :
electron-hole recombination; impact ionisation; semiconductor device models; semiconductor diodes; tunnelling; DC characteristics; Shockley-Read-Hall recombination; analytical model; avalanche breakdown; band-to-band tunneling; circuit simulation; depletion layer; diode model; forward mode; hole continuity equation; p-n junction; reverse modes; trap-assisted tunneling; Analytical models; Avalanche breakdown; Circuit simulation; Diodes; Equations; P-n junctions; SPICE; Temperature dependence; Tunneling; Voltage;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/16.155882
Filename :
155882
Link To Document :
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