DocumentCode :
760999
Title :
Small-signal performance of a quantum well diode
Author :
Ershov, Maxim ; Ryzhii, Victor ; Saito, Kazuyuki
Author_Institution :
Dept. of Comput. Hardware, Aizu Univ., Japan
Volume :
43
Issue :
3
fYear :
1996
fDate :
3/1/1996 12:00:00 AM
Firstpage :
467
Lastpage :
472
Abstract :
We study a small-signal performance of a quantum well (QW) diode with triangular emitter and collector barriers providing thermionic electron transport. Analytical expression for the QW diode admittance is obtained from the rigorous self-consistent small-signal analysis. Frequency dependence of the admittance is determined by a characteristic time of recharging of the QW, which is a strong function of temperature and parameters of the QW diode. Conductance as a function of temperature shows a local maximum corresponding to a resonance between a probe signal and recharging processes. Capacitance of the QW diode depends critically on the efficiency of the electron transport through the QW, and can significantly exceed all geometric capacitances associated with the device structure. Experimental data on conductance and capacitance of the QW diode as functions of temperature and frequency can be used to extract the parameters of the QW, such as QW recombination velocity, ionization energy, etc. Analytical analysis of transient currents in the QW diode allows a transparent explanation why an incremental charge-partitioning technique fails to calculate the capacitance even in the low-frequency limit
Keywords :
electron-hole recombination; semiconductor device models; semiconductor diodes; semiconductor quantum wells; diode admittance; electron transport efficiency; geometric capacitances; incremental charge-partitioning technique; ionization energy; low-frequency limit; quantum well diode; recharging time; recombination velocity; self-consistent small-signal analysis; small-signal performance; thermionic electron transport; triangular collector barriers; triangular emitter barriers; Admittance; Capacitance; Diodes; Electron emission; Failure analysis; Frequency dependence; Probes; Resonance; Temperature dependence; Transient analysis;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/16.485662
Filename :
485662
Link To Document :
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