• DocumentCode
    760999
  • Title

    Small-signal performance of a quantum well diode

  • Author

    Ershov, Maxim ; Ryzhii, Victor ; Saito, Kazuyuki

  • Author_Institution
    Dept. of Comput. Hardware, Aizu Univ., Japan
  • Volume
    43
  • Issue
    3
  • fYear
    1996
  • fDate
    3/1/1996 12:00:00 AM
  • Firstpage
    467
  • Lastpage
    472
  • Abstract
    We study a small-signal performance of a quantum well (QW) diode with triangular emitter and collector barriers providing thermionic electron transport. Analytical expression for the QW diode admittance is obtained from the rigorous self-consistent small-signal analysis. Frequency dependence of the admittance is determined by a characteristic time of recharging of the QW, which is a strong function of temperature and parameters of the QW diode. Conductance as a function of temperature shows a local maximum corresponding to a resonance between a probe signal and recharging processes. Capacitance of the QW diode depends critically on the efficiency of the electron transport through the QW, and can significantly exceed all geometric capacitances associated with the device structure. Experimental data on conductance and capacitance of the QW diode as functions of temperature and frequency can be used to extract the parameters of the QW, such as QW recombination velocity, ionization energy, etc. Analytical analysis of transient currents in the QW diode allows a transparent explanation why an incremental charge-partitioning technique fails to calculate the capacitance even in the low-frequency limit
  • Keywords
    electron-hole recombination; semiconductor device models; semiconductor diodes; semiconductor quantum wells; diode admittance; electron transport efficiency; geometric capacitances; incremental charge-partitioning technique; ionization energy; low-frequency limit; quantum well diode; recharging time; recombination velocity; self-consistent small-signal analysis; small-signal performance; thermionic electron transport; triangular collector barriers; triangular emitter barriers; Admittance; Capacitance; Diodes; Electron emission; Failure analysis; Frequency dependence; Probes; Resonance; Temperature dependence; Transient analysis;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/16.485662
  • Filename
    485662