DocumentCode :
761336
Title :
Real-time and high-speed measurements of charging processes on dielectric surface in vacuum
Author :
Suzuki, Kiyoteru ; Kato, Katsumi ; Hakamata, Yoshimi ; Okubo, Hitoshi
Author_Institution :
Dept. of Electr. Eng., Nagoya Univ., Japan
Volume :
10
Issue :
4
fYear :
2003
Firstpage :
563
Lastpage :
568
Abstract :
In order to investigate the charging mechanisms of solid dielectrics in vacuum, we constructed real-time and high-speed measurement systems for charge density, current pulse, light emission and applied voltage. By applying a negative DC ramped voltage to an electrode with a cathode triple-junction (TJ), we measured the temporal variation of surface charge accumulation and current pulse waveforms expressing the electron emission from TJ, by electrostatic probes. From the measurement results, we explain the step like charging process and propose an electron emission model by taking the electric field and its relaxation by charging into account. In addition, we elucidate the relationship between the charging process and the location of electron emission.
Keywords :
charge measurement; electric current measurement; electric fields; electron emission; flashover; insulation; surface charging; surface potential; voltage measurement; applied voltage; cathode triple-junction; charge density; charging mechanisms; current pulse; dielectric surface; electric field relaxation; electrode; electron emission model; electrostatic probes; high-speed measurement systems; light emission; negative DC ramped voltage; real-time measurement systems; solid dielectrics; step like charging process; surface charge accumulation; vacuum; Charge measurement; Current measurement; Dielectric measurements; Electron emission; Electrostatic measurements; Pulse measurements; Solids; Surface charging; Vacuum systems; Voltage;
fLanguage :
English
Journal_Title :
Dielectrics and Electrical Insulation, IEEE Transactions on
Publisher :
ieee
ISSN :
1070-9878
Type :
jour
DOI :
10.1109/TDEI.2003.1219638
Filename :
1219638
Link To Document :
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