Title :
Fourier-transform analysis of electrostatic potential distribution through a thick slit
Author :
Kim, Youn S. ; Eom, Hyo J.
Author_Institution :
Dept. of Electr. Eng., Korea Adv. Inst. of Sci. & Technol., Seoul, South Korea
fDate :
2/1/1996 12:00:00 AM
Abstract :
A potential distribution through a slit in a thick conducting plane is examined. The Fourier-transform is used to represent the potential in the spectral domain and the boundary conditions are enforced to represent a solution in closed form. The solution is in a rapidly converging series so that it is numerically efficient. The Fourier-transform approach is novel in that it allows one to obtain a simple series solution without recourse to the Schwarz-Christoffel transformation
Keywords :
Fourier analysis; Fourier transforms; convergence of numerical methods; electric fields; electric potential; spectral-domain analysis; Fourier-transform analysis; boundary conditions; closed form solution; electrostatic potential distribution; rapidly converging series; simple series solution; spectral domain; thick conducting plane; thick slit; Boundary conditions; Closed-form solution; Electrostatic analysis; Fourier transforms; Geometry; Laplace equations; Radiofrequency interference; Scattering;
Journal_Title :
Electromagnetic Compatibility, IEEE Transactions on
