• DocumentCode
    761840
  • Title

    A Bayesian Independence Test for Small Datasets

  • Author

    Ku, Chin-Jen ; Fine, Terrence L.

  • Author_Institution
    Sch. of Electr. & Comput. Eng., Cornell Univ., Ithaca, NY
  • Volume
    54
  • Issue
    10
  • fYear
    2006
  • Firstpage
    4026
  • Lastpage
    4031
  • Abstract
    We propose a Bayesian test for independence among signals where only a small dataset is available. Traditional frequentist approaches often fail in this case due to inaccurate estimation of either the source statistical models or the threshold used by the test statistics. In addition, these frequentist methods cannot incorporate prior information into the computation of the test statistics. Our procedure renders parametric the nonparametric problem of testing for independence by quantizing the observed data samples into a table of cell counts. The test statistic is based on the likelihood of the observed cell counts under the independence hypothesis where the marginal cell probabilities are modeled by independent symmetric Dirichlet priors. We apply our Bayesian test to validate the solutions to the problem of blind source separation with small datasets using both synthetic and real-life benchmark data. The experimental results indicate that our approach can overcome the scarcity of data samples and significantly outperform the standard frequentist parametric methods with a proper selection of the prior parameters
  • Keywords
    Bayes methods; blind source separation; Bayesian independence test; blind source separation; frequentist methods; independent symmetric Dirichlet priors; marginal cell probabilities; source statistical models; Bayesian methods; Blind source separation; Independent component analysis; Parametric statistics; Probability; Signal processing; Signal processing algorithms; Source separation; Statistical analysis; Testing; Bayesian statistics; Dirichlet priors; blind source separation (BSS); independent component analysis (ICA); statistical signal processing (SSP); test of independence;
  • fLanguage
    English
  • Journal_Title
    Signal Processing, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1053-587X
  • Type

    jour

  • DOI
    10.1109/TSP.2006.880243
  • Filename
    1703868