Title :
Finite-element time-domain algorithms for modeling linear Debye and Lorentz dielectric dispersions at low frequencies
Author :
Stoykov, Nikolay S. ; Kuiken, Todd A. ; Lowery, Madeleine M. ; Taflove, Allen
Author_Institution :
Rehabilitation Inst. of Chicago, IL, USA
Abstract :
We present what we believe to be the first algorithms that use a simple scalar-potential formulation to model linear Debye and Lorentz dielectric dispersions at low frequencies in the context of finite-element time-domain (FETD) numerical solutions of electric potential. The new algorithms, which permit treatment of multiple-pole dielectric relaxations, are based on the auxiliary differential equation method and are unconditionally stable. We validate the algorithms by comparison with the results of a previously reported method based on the Fourier transform. The new algorithms should be useful in calculating the transient response of biological materials subject to impulsive excitation. Potential applications include FETD modeling of electromyography, functional electrical stimulation, defibrillation, and effects of lightning and impulsive electric shock.
Keywords :
electric shocks; electromyography; finite element analysis; lightning; neuromuscular stimulation; physiological models; EMG; auxiliary differential equation method; biological materials transient response; defibrillation; electrodiagnostics; functional electrical stimulation; impulsive electric shock; lightning effects; multiple-pole dielectric relaxations; simple scalar-potential formulation; transient analysis; Biological materials; Context modeling; Dielectrics; Differential equations; Electric potential; Finite element methods; Fourier transforms; Frequency; Time domain analysis; Transient response; Algorithms; Computer Simulation; Electric Conductivity; Electromagnetic Fields; Finite Element Analysis; Models, Biological; Models, Neurological; Radiometry; Reproducibility of Results; Scattering, Radiation; Sensitivity and Specificity;
Journal_Title :
Biomedical Engineering, IEEE Transactions on
DOI :
10.1109/TBME.2003.816083