DocumentCode
762105
Title
In vivo measurement of the brain and skull resistivities using an EIT-based method and the combined analysis of SEF/SEP data
Author
Goncalve, S. ; de Munck, J.C. ; Verbunt, J.P.A. ; Heethaar, R.M. ; Silva, F. H Lopes da
Author_Institution
MEG Centre, Vrije Univ. Med. Centre, Amsterdam, Netherlands
Volume
50
Issue
9
fYear
2003
Firstpage
1124
Lastpage
1127
Abstract
Results of "in vivo" measurements of the skull and brain resistivities are presented for six subjects. Results are obtained using two different methods, based on spherical head models. The first method uses the principles of electrical impedance tomography (EIT) to estimate the equivalent electrical resistivities of brain (ρbrain), skull (ρskull) and skin (ρskin) according to S. Goncalves et al., Physiol. Meas., vol. 21, p. 379-93 (2000).. The second one estimates the same parameters through a combined analysis of the evoked somatosensory cortical response, recorded simultaneously using magnetoencephalography (MEG) and electroencephalography (EEG). The EIT results, obtained with the same relative skull thickness (0.05) for all subjects, show a wide variation of the ratio ρskull/ρbrain among subjects (average =72, SD=48%). However, the ρskull/ρbrain ratios of the individual subjects are well reproduced by combined analysis of somatosensory evoked fields (SEF) and somatosensory evoked potentials (SEP). These preliminary results suggest that the ρskull/ρbrain variations over subjects cannot be disregarded in the EEG inverse problem (IP) when a spherical model is used. The agreement between EIT and SEF/SEP points to the fact that whatever the source of variability, the proposed EIT-based method skull/ρbrain, ρbrain, ρskull and ρskin.
Keywords
brain models; electric impedance imaging; electric resistance measurement; electroencephalography; inverse problems; medical signal processing; somatosensory phenomena; EEG; EEG inverse problem; MEG; brain resistivity measurement; electric impedance tomography; electrodiagnostics; evoked somatosensory cortical response; relative skull thickness; skull resistivity measurement; somatosensory evoked fields; somatosensory evoked potentials; Conductivity; Electric resistance; Electroencephalography; Impedance; In vivo; Magnetic heads; Parameter estimation; Skin; Skull; Tomography; Brain; Brain Mapping; Electric Impedance; Electroencephalography; Evoked Potentials, Somatosensory; Head; Models, Biological; Reproducibility of Results; Sensitivity and Specificity; Skin Physiology; Skull; Tomography;
fLanguage
English
Journal_Title
Biomedical Engineering, IEEE Transactions on
Publisher
ieee
ISSN
0018-9294
Type
jour
DOI
10.1109/TBME.2003.816072
Filename
1220220
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