• DocumentCode
    762233
  • Title

    Frequency domain testing of ADCs

  • Author

    Mielke, Joseph A.

  • Author_Institution
    Credence Syst. Corp., Beaverton, OR, USA
  • Volume
    13
  • Issue
    1
  • fYear
    1996
  • Firstpage
    64
  • Lastpage
    69
  • Abstract
    Aimed at design and test engineers making the transition from strictly digital devices to devices with both digital and analog content, this tutorial introduces frequency domain analysis for the testing of mixed-signal devices. The author describes dynamic testing of analog-to-digital converters using Fourier analysis, including coherent sampling techniques. He also covers the challenges of implementing these techniques in a real system and analyzing results to identify problems
  • Keywords
    Fourier analysis; analogue-digital conversion; circuit testing; dynamic testing; frequency-domain analysis; ADC; Fourier analysis; analog-to-digital converters; coherent sampling; dynamic testing; frequency domain testing; mixed-signal device testing; Analog integrated circuits; Analog-digital conversion; Circuit testing; Clocks; Digital control; Feedback control; Frequency domain analysis; Hardware; Integrated circuit technology; Integrated circuit testing;
  • fLanguage
    English
  • Journal_Title
    Design & Test of Computers, IEEE
  • Publisher
    ieee
  • ISSN
    0740-7475
  • Type

    jour

  • DOI
    10.1109/54.485784
  • Filename
    485784