DocumentCode
762233
Title
Frequency domain testing of ADCs
Author
Mielke, Joseph A.
Author_Institution
Credence Syst. Corp., Beaverton, OR, USA
Volume
13
Issue
1
fYear
1996
Firstpage
64
Lastpage
69
Abstract
Aimed at design and test engineers making the transition from strictly digital devices to devices with both digital and analog content, this tutorial introduces frequency domain analysis for the testing of mixed-signal devices. The author describes dynamic testing of analog-to-digital converters using Fourier analysis, including coherent sampling techniques. He also covers the challenges of implementing these techniques in a real system and analyzing results to identify problems
Keywords
Fourier analysis; analogue-digital conversion; circuit testing; dynamic testing; frequency-domain analysis; ADC; Fourier analysis; analog-to-digital converters; coherent sampling; dynamic testing; frequency domain testing; mixed-signal device testing; Analog integrated circuits; Analog-digital conversion; Circuit testing; Clocks; Digital control; Feedback control; Frequency domain analysis; Hardware; Integrated circuit technology; Integrated circuit testing;
fLanguage
English
Journal_Title
Design & Test of Computers, IEEE
Publisher
ieee
ISSN
0740-7475
Type
jour
DOI
10.1109/54.485784
Filename
485784
Link To Document