• DocumentCode
    762252
  • Title

    Intel and the myths of test

  • Author

    Thompson, Kenneth M.

  • Author_Institution
    Technol., Manuf., & Eng. Group, Intel Corp., CA, USA
  • Volume
    13
  • Issue
    1
  • fYear
    1996
  • Firstpage
    79
  • Lastpage
    81
  • Abstract
    The author describes device testing at Intel, a company that tests 50 million microprocessors a year. He notes some myths that have grown up around testing and addresses the challenges facing test engineers, test system designers, and researchers
  • Keywords
    VLSI; computer testing; integrated circuit testing; microprocessor chips; Intel; VLSI; device testing; microprocessor testing; researchers; test engineers; test system designers; Bridge circuits; Circuit faults; Circuit testing; Costs; Design for testability; Ice; Logic testing; Microprocessors; Pins; Very large scale integration;
  • fLanguage
    English
  • Journal_Title
    Design & Test of Computers, IEEE
  • Publisher
    ieee
  • ISSN
    0740-7475
  • Type

    jour

  • DOI
    10.1109/54.485786
  • Filename
    485786
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=762252