Analysis of Waveguide Discontinuities by a Fourth-Order Finite-Difference Reflective Scheme

Author

Zhang, Hua ; Guo, Qingyi ; Huang, Wei-Ping

Author_Institution

Dept. of Electr. & Comput. Eng., McMaster Univ., Hamilton, Ont.

Volume

25

Issue

2

fYear

2007

Firstpage

556

Lastpage

561

Abstract

A highly accurate reflective scheme is developed for analysis of two-dimensional (2-D) waveguide discontinuities by using the fourth-order finite-difference (FD) formula. It is demonstrated that the new method achieves a significantly higher accuracy/computation cost ratio in comparison with the conventional FD method. Furthermore, the advantage of the new method is more pronounced for the case of high-index-contrast structures with small feature sizes

Keywords

finite difference methods; integrated optics; light reflection; optical waveguide theory; waveguide discontinuities; accuracy-computation cost ratio; fourth-order finite-difference formula; high-index-contrast structures; integrated photonic devices; reflective scheme; waveguide discontinuities; Computational efficiency; Finite difference methods; Integral equations; Maxwell equations; Optical reflection; Optical waveguides; Time domain analysis; Transmission line matrix methods; Waveguide discontinuities; Waveguide junctions; Finite-difference (FD) methods; high-index-contrast waveguides; reflection; waveguide discontinuities;

fLanguage

English

Journal_Title

Lightwave Technology, Journal of

Publisher

ieee

ISSN

0733-8724

Type

jour

DOI

10.1109/JLT.2006.889136

Filename

4142823