• DocumentCode
    762837
  • Title

    Concave-Suspended High-Q Solenoid Inductors With an RFIC-Compatible Bulk-Micromachining Technology

  • Author

    Gu, Lei ; Li, Xinxin

  • Author_Institution
    Inst. of Microsyst. & Inf. Technol., Chinese Acad. of Sci., Shanghai
  • Volume
    54
  • Issue
    4
  • fYear
    2007
  • fDate
    4/1/2007 12:00:00 AM
  • Firstpage
    882
  • Lastpage
    885
  • Abstract
    Presented in this brief is a concave-suspended solenoid inductor that can be post-CMOS integrated into a low-resistivity silicon substrate using a novel radio frequency integrated circuit (RFIC)-compatible micromachining technology. The three-mask processes include photoresist spray coating, XeF2 gaseous etching and copper electroplating, etc. The fabricated 11.5-turn inductor is measured with 2.96-nH inductance at 5.35 GHz, where the peak Q-factor is as high as about 45. Even with a compact layout (50% area occupation saved), the 8.5-turn inductor is still measured with 2.78 nH and peak Q of about 28 at 4.90 GHz. Both finite element simulation and shock testing results show that the suspended inductor is almost free of influence from environmental vibration and shock. Featuring high-Q performance and robust properties, the RFIC-compatible inductors are promising for high-performance RFIC applications
  • Keywords
    CMOS integrated circuits; Q-factor; elemental semiconductors; finite element analysis; inductors; micromachining; radiofrequency integrated circuits; silicon; xenon compounds; 4.90 GHz; 5.35 GHz; CMOS; Q-factor; RFIC-compatible bulk-micromachining technology; RFIC-compatible inductors; Si; XeF2; concave-suspended high-Q solenoid inductors; copper electroplating; environmental shock; environmental vibration; finite element simulation; gaseous etching; inductor; photoresist spray coating; radio frequency integrated circuit; shock testing; silicon substrate; Coatings; Electric shock; Inductors; Integrated circuit technology; Micromachining; Radiofrequency integrated circuits; Resists; Silicon; Solenoids; Spraying; $Q$- factor; Bulk micromachining; radio frequency integrated circuit (RFIC); solenoid inductors;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/TED.2007.892362
  • Filename
    4142881