DocumentCode :
763090
Title :
TCAD Methodology for Design of SCR Devices for Electrostatic Discharge (ESD) Applications
Author :
Salcedo, Javier A. ; Liou, Juin J. ; Liu, Zhiwei ; Vinson, James E.
Author_Institution :
Corporate ESD Group, Analog Devices, Wilmington , MA
Volume :
54
Issue :
4
fYear :
2007
fDate :
4/1/2007 12:00:00 AM
Firstpage :
822
Lastpage :
832
Abstract :
Realization of on-chip electrostatic discharge (ESD) protection requires extensive technical experience and know-how. A technology computer-aided design (TCAD) methodology aimed to assist in the design and implementation of robust ESD devices is developed and presented. The methodology provides a systematic and practical means for the evaluation and optimization of ESD devices in a simulation environment. Advanced silicon-controlled-rectifier devices are considered to illustrate the approach, and experimental data measured from these devices are also included in support of the TCAD development
Keywords :
electrostatic discharge; technology CAD (electronics); thyristors; SCR devices design; TCAD; blocking junction; on-chip electrostatic discharge protection; silicon-controlled-rectifier devices; technology computer-aided design methodology; trigger voltage; Application software; Circuits; Computational modeling; Design automation; Design methodology; Electrostatic discharge; Protection; Rectifiers; Robustness; Thyristors; Blocking junction; computer-aided design; electrostatic discharge (ESD); silicon-controlled rectifier (SCR); trigger voltage;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/TED.2007.891251
Filename :
4142904
Link To Document :
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