• DocumentCode
    763152
  • Title

    Variable tapered pareto buffer design and implementation allowing run-time configuration for low-power embedded SRAMs

  • Author

    Wang, Hua ; Miranda, Miguel ; Papanikolaou, Antonis ; Catthoor, Francky ; Dehaene, Wim

  • Author_Institution
    Katholieke Univ. Leuven, Heverlee, Belgium
  • Volume
    13
  • Issue
    10
  • fYear
    2005
  • Firstpage
    1127
  • Lastpage
    1135
  • Abstract
    This paper presents a novel formalized technique for variable tapered buffer design achieving Pareto optimal energy-delay tradeoffs. Our main focus lies on the drivers typically found in embedded SRAMs. Much work has been done for variable tapered buffer design explicitly targeting energy (and/or area) tradeoffs for a given target delay. In contrast, the formalized techniques presented here are capable of providing all existing Pareto configurations achieving optimal energy/delay tradeoffs, and this is applicable for the full range of all possible delay constraints. Based on such techniques, a transistor-level implementation is also presented to allow a discrete set of Pareto configurations (from high-speed to low-energy) to be selected at run-time. This implementation has been validated via SPICE simulations for a 65-nm CMOS technology, confirming that a very wide range in delay (more than a factor 2) and energy consumption (up to 40%) can be achieved at the SRAM level, including process variability impact effects present in CMOS nanometer technologies.
  • Keywords
    CMOS digital integrated circuits; Pareto optimisation; SRAM chips; buffer circuits; circuit optimisation; embedded systems; high-speed integrated circuits; integrated circuit design; low-power electronics; nanoelectronics; 65 nm; CMOS nanometer technology; Pareto configurations; Pareto optimal energy-delay tradeoffs; embedded SRAM; formalized technique; run-time configuration; transistor-level implementation; variable tapered Pareto buffer design; Biotechnology; CMOS process; CMOS technology; Circuit simulation; Delay effects; Energy consumption; Process design; Random access memory; Runtime; SPICE; CMOS buffers; Pareto tradeoffs; SRAM; configurable circuits; low power; nanometer design; process variations;
  • fLanguage
    English
  • Journal_Title
    Very Large Scale Integration (VLSI) Systems, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1063-8210
  • Type

    jour

  • DOI
    10.1109/TVLSI.2005.859480
  • Filename
    1561242