• DocumentCode
    763229
  • Title

    Extracting secret keys from integrated circuits

  • Author

    Lim, Daihyun ; Lee, Jae W. ; Gassend, Blaise ; Suh, G. Edward ; Van Dijk, Marten ; Devadas, Srinivas

  • Author_Institution
    Massachusetts Inst. of Technol., Cambridge, MA, USA
  • Volume
    13
  • Issue
    10
  • fYear
    2005
  • Firstpage
    1200
  • Lastpage
    1205
  • Abstract
    Modern cryptographic protocols are based on the premise that only authorized participants can obtain secret keys and access to information systems. However, various kinds of tampering methods have been devised to extract secret keys from conditional access systems such as smartcards and ATMs. Arbiter-based physical unclonable functions (PUFs) exploit the statistical delay variation of wires and transistors across integrated circuits (ICs) in manufacturing processes to build unclonable secret keys. We fabricated arbiter-based PUFs in custom silicon and investigated the identification capability, reliability, and security of this scheme. Experimental results and theoretical studies show that a sufficient amount of inter-chip variation exists to enable each IC to be identified securely and reliably over a practical range of environmental variations such as temperature and power supply voltage. We show that arbiter-based PUFs are realizable and well suited to build, for example, key-cards that need to be resistant to physical attacks.
  • Keywords
    integrated circuits; public key cryptography; security; arbiter-based physical unclonable functions; cryptographic protocols; integrated circuit identification; inter-chip variation; secret key extraction; tamper resistance; Cryptographic protocols; Data mining; Delay; Information systems; Integrated circuit reliability; Manufacturing processes; Power system reliability; Power system security; Silicon; Wires; Identification; physical random function; process variation; tamper resistance; unclonability;
  • fLanguage
    English
  • Journal_Title
    Very Large Scale Integration (VLSI) Systems, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1063-8210
  • Type

    jour

  • DOI
    10.1109/TVLSI.2005.859470
  • Filename
    1561249