• DocumentCode
    763316
  • Title

    Reliability of code density test for high resolution ADCs

  • Author

    Ginetti, B. ; Jespers, P.

  • Author_Institution
    Lab. de Microelectron., Univ. Catholique de Louvain, Louvain-la-Neuve, Belgium
  • Volume
    27
  • Issue
    24
  • fYear
    1991
  • Firstpage
    2231
  • Lastpage
    2233
  • Abstract
    The effect of convertor internal noise on its output code histogram is analysed. Simulations show that large linearity errors, including missing codes, may vanish when sufficient noise is experienced. Consequently, the code density test is likely to yield a differential nonlinearity error within +or-0.5 LSB for any high accuracy noisy convertor.
  • Keywords
    analogue-digital conversion; electron device noise; integrated circuit testing; reliability; code density test; convertor internal noise; differential nonlinearity error; high accuracy noisy convertor; high resolution ADCs; linearity errors; missing codes; output code histogram; test reliability;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el:19911380
  • Filename
    109504
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=763316