Title :
Reliability of code density test for high resolution ADCs
Author :
Ginetti, B. ; Jespers, P.
Author_Institution :
Lab. de Microelectron., Univ. Catholique de Louvain, Louvain-la-Neuve, Belgium
Abstract :
The effect of convertor internal noise on its output code histogram is analysed. Simulations show that large linearity errors, including missing codes, may vanish when sufficient noise is experienced. Consequently, the code density test is likely to yield a differential nonlinearity error within +or-0.5 LSB for any high accuracy noisy convertor.
Keywords :
analogue-digital conversion; electron device noise; integrated circuit testing; reliability; code density test; convertor internal noise; differential nonlinearity error; high accuracy noisy convertor; high resolution ADCs; linearity errors; missing codes; output code histogram; test reliability;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19911380
