DocumentCode :
763331
Title :
Development of micromechanical testing machine and its application
Author :
Park, Jun-Hyub
Author_Institution :
MEMS Lab., Samsung Adv. Inst. of Technol., Kyongki, South Korea
Volume :
25
Issue :
2
fYear :
2002
fDate :
6/1/2002 12:00:00 AM
Firstpage :
317
Lastpage :
322
Abstract :
In this study, a small-sized DC motor type axial mechanical testing machine was developed to be utilized for fatigue testing of electronic parts such as ICs, etc. Thermal fatigue cracking in a beam lead in μBGA, a type of chip scale package (CSP), was identified as a major failure mode in the quality assurance test or in the field. The beam lead was made with copper foil. Thus, the reliability of the μBGA was strongly dependent on the fatigue characteristics of the copper used. In this study, the four kinds of beam leads made by different processes, were tested to obtain the tensile strength and fatigue characteristics and compared them with each other. The tensile and fatigue strength of the beam lead fabricated by a chemical polishing process with dipping time of 50 min is the best among the beam leads tested. The result of this study enables us to estimate the reliability of the μBGA without the temperature cycling test of a fully assembled μBGA
Keywords :
ball grid arrays; beam-lead devices; chip scale packaging; copper; fatigue cracks; fatigue testing; integrated circuit reliability; integrated circuit testing; mechanical testing; tensile strength; test equipment; thermal stress cracking; μBGA; CSP; Cu; Cu foil; DC motor type mechanical testing machine; IC testing; beam lead testing; chip scale package; creep test; electronic parts; fatigue characteristics; fatigue strength; fatigue testing; micro-BGA; micromechanical testing machine; quality assurance test; reliability estimation; static test; tensile strength; thermal fatigue crack; Chemical processes; Chip scale packaging; Copper; DC motors; Electronic equipment testing; Electronic packaging thermal management; Fatigue; Micromechanical devices; Packaging machines; Quality assurance;
fLanguage :
English
Journal_Title :
Components and Packaging Technologies, IEEE Transactions on
Publisher :
ieee
ISSN :
1521-3331
Type :
jour
DOI :
10.1109/TCAPT.2002.1010023
Filename :
1010023
Link To Document :
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