Variable-sampling-rate sigma-delta modulator for instrumentation and measurement

Author

Xu, Xiaochu ; Lucas, Michael S P

Author_Institution

Instrum. Lab., Kansas State Univ., Manhattan, KS, USA

Volume

44

Issue

5

fYear

1995

fDate

10/1/1995 12:00:00 AM

Firstpage

929

Lastpage

932

Abstract

We have designed, built, and tested a second-order, variable-sampling-rate, sigma-delta analog-to-digital converter (ADC) which operates over an input frequency range from 1 Hz to 8 kHz. Experimental results show that this circuit performs well and maintains the same signal-to-noise ratio over an input frequency range from 1 Hz to 1 kHz although it was built with individually packaged operational amplifiers and analog switches. For input frequencies above 1 kHz the circuit still performs well, but the signal-to-noise ratio varies with input frequency

Keywords

circuit noise; sampled data circuits; sigma-delta modulation; signal processing equipment; 1 Hz to 8 kHz; analog switches; input frequency range; instrumentation; measurement; operational amplifiers; second-order ADC; sigma-delta analog-to-digital converter; signal-to-noise ratio; variable-sampling-rate sigma-delta modulator; Analog-digital conversion; Circuit testing; Delta-sigma modulation; Frequency conversion; Instruments; Operational amplifiers; Packaging; Signal to noise ratio; Switches; Switching circuits;

fLanguage

English

Journal_Title

Instrumentation and Measurement, IEEE Transactions on

Publisher

ieee

ISSN

0018-9456

Type

jour

DOI

10.1109/19.414502

Filename

414502