• DocumentCode
    763766
  • Title

    Corrections to "Segmental minimum Bayes-risk decoding for automatic speech recognition"

  • Author

    Goel, Vaibhava ; Kumar, Shankar ; Byrne, William

  • Author_Institution
    IBM T. J. Watson Res. Center, Yorktown Heights, NY, USA
  • Volume
    14
  • Issue
    1
  • fYear
    2006
  • Firstpage
    356
  • Lastpage
    357
  • Abstract
    The purpose of this paper is to correct and expand upon the experimental results presented in our recently published paper [1]. In [1, Sec. III-B], we present a risk-based lattice cutting (RLC) procedure to segment ASR word lattices into sequences of smaller sublattices. The purpose of this procedure is to restructure the original lattice to improve the efficiency of minimum Bayes-risk (MBR) and other lattice rescoring procedures. Given that the segmented lattices are to be rescored, it is crucial that no paths from the original lattice be lost in the segmentation process. In the experiments reported in our original publication, some of the original paths were inadvertently discarded from the segmented lattices. This affected the performance of the MBR results presented. In this paper, we briefly review the segmentation algorithm and explain the flaw in our previous experiments. We find consistent minor improvements in word error rate (WER) under the corrected procedure. More importantly, we report experiments confirming that the lattice segmentation procedure does indeed preserve all the paths in the original lattice.
  • Keywords
    Bayes methods; decoding; speech coding; speech recognition; automatic speech recognition; lattice rescoring procedures; lattice segmentation procedure; risk-based lattice cutting procedure; segmental minimum Bayes-risk decoding; word error rate; word lattices; Automatic speech recognition; Decoding; Error analysis; Lattices; Natural languages; Programmable control; Speech processing;
  • fLanguage
    English
  • Journal_Title
    Audio, Speech, and Language Processing, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1558-7916
  • Type

    jour

  • DOI
    10.1109/TSA.2005.854087
  • Filename
    1561291