Title :
Integrated force measurement for on-line cutting geometry inspection
Author :
Rao, Balkrishna C. ; Gao, Robert X. ; Friedrich, Craig R.
Author_Institution :
Inst. of Micromanuf., Louisiana Tech. Univ., Ruston, LA, USA
fDate :
10/1/1995 12:00:00 AM
Abstract :
A novel on-line cutting geometry inspection technique based on the integrated force-sensing method has been developed. A piezoelectric force sensor, mounted at the back of a single crystal diamond tool, was used to measure the cutting forces encountered by the tool system as it plunge-cut parallel micro flow channels on copper foils about 125 μm in thickness. The force data were then converted by a software code which calculates the geometrical dimensions (depth and width) of the micro channels that had been cut. A series of experiments were conducted for four different feeds: 0.1, 0.3, 1.0, and 5.0 μm/rev., at a constant workpiece speed of 2,400 rpm. Error analysis showed that the maximum relative error of the measurement, as compared to the results from the theoretical analysis, is 9.8%. By incorporating this force sensing technique into the machine tool control system, a real-time control unit can be implemented which conducts on-line adjustment of the diamond cutting performance to improve manufacturing quality
Keywords :
cutting; error analysis; force measurement; industrial control; inspection; machine tools; measurement errors; piezoelectric transducers; 125 mum; Cu; Cu foils; cutting force measurement; diamond cutting performance; error analysis; geometrical dimensions; integrated force measurement; machine tool control system; manufacturing quality; maximum relative measurement error; online adjustment; online cutting geometry inspection; parallel micro flow channels; piezoelectric force sensor; plunge-cutting; real-time control unit; single crystal diamond tool; software code; Control systems; Copper; Feeds; Fluid flow measurement; Force control; Force measurement; Force sensors; Geometry; Inspection; Thickness measurement;
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on